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Frontics Products

Frontics’s instrumented indentation testers are high-performance devices capable of conducting non-destructive measurement of material tensile properties, residual stress, fracture toughness, and hardness in both industrial settings and laboratory environments.
Our instrumented indentation testers are classified into macro, micro, and nano categories based on measurement range and purpose, and are further divided into the AIS series and Stress Mapper series to provide optimal solutions tailored to diverse measurement needs.

Classification
AIS FS
AIS FS
Features
  • - TS, RS, FT, HN
  • - Lightweight model
Specifications
  • - Weight: 3.2kg
  • - Maximum Load: 120kgf
  • - Resolution: 2.0gf/ 0.1 μm
AIS3000
AIS3000
Features
  • - TS, RS, FT, HN
  • - Both industrial and laboratory
Specifications
  • - Weight: 7kg
  • - Maximum Load: 300kgf
  • - Resolution: 5.6gf/ 0.1μm
AIS3000HD
AIS3000HD
Features
  • - TS, RS, FT, HN
  • - Designed for nuclear facility (radiation shielding, noise, vibration)
Specifications
  • - Weight: 5kg
  • - Maximum Load: 120kgf
  • - Resolution: 2.0gf/0.1 μm
Macro Stress Mapper
Macro Stress Mapper
Features
  • - 180x microscope
  • - wireless automatic adjustment jig
  • - mapping functionality
Specifications
  • - Weight: 230kg
  • - Maximum Load: 100kgf
  • - Resolution: 2.0gf/0.1μm
Micro Stress Mapper
Micro Stress Mapper
Features
  • - 1500x microscope
  • - TS, RS, FT, HN
  • - mapping functionality
Specifications
  • - Weight: 82kg
  • - Maximum Load: 2kgf
  • - Resolution: 0.01gf/10nm
Nano Stress Mapper
Nano Stress Mapper
Features
  • - 2000x microscope
  • - stress distribution, adhesion
  • - mapping functionality
Specifications
  • - Weight: 100kg
  • - Maximum Load: 200mN
  • - Resolution: 10nN/0.04nm
Classification
Macro Stress Mapper
Macro Stress Mapper
Features
  • - 180x microscope
  • - wireless automatic adjustment jig
  • - mapping functionality
Specifications
  • - Weight: 230kg
  • - Maximum Load: 100kgf
  • - Resolution: 2.0gf/0.1μm
Micro Stress Mapper
Micro Stress Mapper
Features
  • - 1500x microscope
  • - TS, RS, FT, HN
  • - mapping functionality
Specifications
  • - Weight: 82kg
  • - Maximum Load: 2kgf
  • - Resolution: 0.01gf/10nm
Nano Stress Mapper
Nano Stress Mapper
Features
  • - 2000x microscope
  • - stress distribution, adhesion
  • - mapping functionality
Specifications
  • - Weight: 100kg
  • - Maximum Load: 200mN
  • - Resolution: 10nN/0.04nm
AIS FS
AIS FS
Features
  • - TS, RS, FT, HN
  • - Lightweight model
Specifications
  • - Weight: 3.2kg
  • - Maximum Load: 120kgf
  • - Resolution: 2.0gf/ 0.1 μm
AIS3000
AIS3000
Features
  • - TS, RS, FT, HN
  • - Both industrial and laboratory
Specifications
  • - Weight: 7kg
  • - Maximum Load: 300kgf
  • - Resolution: 5.6gf/ 0.1μm
AIS3000HD
AIS3000HD
Features
  • - TS, RS, FT, HN
  • - Designed for nuclear facility (radiation shielding, noise, vibration)
Specifications
  • - Weight: 5kg
  • - Maximum Load: 120kgf
  • - Resolution: 2.0gf/0.1 μm