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Frontics Products

Frontics’s instrumented indentation testers are high-performance devices capable of conducting non-destructive measurement of material tensile properties, residual stress, fracture toughness, and hardness in both industrial settings and laboratory environments.
Our instrumented indentation testers are classified into macro, micro, and nano categories based on measurement range and purpose, and are further divided into the AIS series and Stress Mapper series to provide optimal solutions tailored to diverse measurement needs.

Nano Stress Mapper
Nano Stress Mapper
Nano Stress Mapper
Nano Stress Mapper

반도체 혹은 소형 전자 부품 시험에 용이
Thin Film 응력 분포 측정

Features
  • - Measures stress distribution and interfacial adhesion of semiconductors, small electronic components, and thin films
  • - Allows precise measurement location verification with up to 2000x magnification using a microscope
  • - Equipped with automated testing (mapping) functionality
  • - Acquires load-displacement curves at the nanoscale using a piezo system
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Specifications
Size
548x680x360 mm
Resolution
10 nN / 0.04 nm
Weight
100 kg
Maximum Stroke
10 μm
Maximum Load
200 mN
Applied LoadSpeed
1 ~ 12,000 nm/sec