Material property evaluation equipment company | Frontics Co., Ltd. Material property evaluation equipment company | Frontics Co., Ltd.

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Frontics' products have been certified for their excellence and reliability,
and we provide test services through professional engineers with long experience.

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Nano Stress Mapper

Nano Stress Mapper

Easy to test for semiconductors or small electronic components
Measurement of stress distribution in Thin Film

Electronic catalog

  • Hardware

  • Software

Hardware

  • Measurement position can be determined using Microscope (maximum magnification: 2000 times)
  • Stable Load and Displacement Curve (L-h curve) of Nano Region can be obtained

  • Model

  • Nano Stress Mapper

  • Size

  • 548x680x360mm

  • Weight

  • 100kg

  • Maximum Load

  • 200mN

  • Resolution

  • 10nN / 0.04nm

  • Maximum travel distance

  • 10μm

  • Loading rate

  • 1 ~ 12,000nm/sec

  • Communication method

  • USB

Software

  • Automatic test (Mapping) possible
  • Provides interface adhesion measurement function
  • Load and displacement acquisition using piezo system

  • RS

  • Installed

  • Hv

  • Installed

  • TS

  • Optional

  • Adhesion

  • Optional